Symposium H
This Symposium focuses on recent advances in the structural, microstructural, and mechanical characterization of coatings and thin films, which enhance our understanding of the growth and surface modification processes as well as the fundamental structure-property-processing relationships. Of interest are contributions that either highlight the application of, or draw attention to, recent advances in analytical methods, characterization techniques, and novel nano-mechanical testing methods for coating evaluation. Analytical methods may include numerical evaluation and quantification procedures (e.g., factor analysis, depth profiling, 3D mapping, etc.) to reveal the micro- and nano-structure, chemical composition, residual stress, chemical states, and phases of coatings, thin films, interfaces, and surfaces during or after surface modification. Micro- and nanomechanical methods may include compression, bending, or toughness testing to determine coating behavior, particularly at elevated/service temperatures and in harsh environments, and the relationship to coating performance and lifetime. Residual stress analysis, phase characterization, surface topography probes, compositional analysis, high-resolution spatial imaging and analysis, and hardness measurements continue to be subjects of interest in the sessions. In-situ characterization methods and other novel techniques presenting the combination between microstructural nano-mechanical probes are highly encouraged.
H1: Spatially-resolved and In-Situ Characterization of Thin Films and Engineered Surfaces:
This session deals with all aspects concerning novel spatially-resolved structural, microstructural, and chemical characterization techniques, especially those that advance the in-depth understanding of the relationship between the processing, the structure, and the properties of thin films and engineered surfaces. Particular attention will be given to papers using cutting-edge experiments to provide information on the microstructural evolution of thin films, including in-situ measurements during film growth, spatially resolved analysis of residual stress, and three-dimensional chemical mapping. Emphasis will be given to novel high-resolution techniques, such as Atom Probe Tomography, X-ray nano-diffraction, advanced TEM characterization, micro-Raman spectroscopy, etc. Papers are furthermore also solicited in the emerging area of three-dimensional microstructural characterization in small volumes, such as FIB/SEM tomography, in-situ EBSD, and/or ToF-SIMS 3D mapping.
H1. Invited Speakers:
- Wendy Gu, Stanford University, USA
- Joshua Kacher, Georgia Tech University, USA
H2: Advanced Mechanical Testing of Surfaces, Thin Films, Coatings, and Small Volumes:
This session covers advanced mechanical characterization techniques for surfaces, thin films, and coatings with a focus on the development of novel methods rather than the application of standard methods to new materials. This includes novel methods of performing nanoindentation testing or analysis methods and testing of micro-scale testing geometries produced using focused ion beam (FIB) machining or issues related to the FIB-machined structures. Particular attention will be given to papers providing details on developing techniques such as novel fracture testing geometries. Emphasis will be given to testing techniques performed in situ in the SEM, TEM, Raman, X-ray beamline, etc.
H2. Invited Speakers:
- Dan Gianola, UC Santa Barbara, USA
- Andrea Maria Hodge, University of Southern California, USA
H3: Advanced Characterization of Coatings and Small Volumes in Extreme and Cyclic Conditions
This session covers the advanced characterization and mechanical behavior of coatings and small volumes under harsh, cyclic, and/or unusual conditions, such as high or cryogenic temperatures, radiation, hydrogen embrittlement and high strain rates. Particular attention will be given to papers providing characterization in-situ, rather than after mechanical exposure: e.g. nanoindentation testing performed at high temperatures rather than after an annealing treatment in a separate furnace. Emphasis will be given to works that show progress pushing the testing envelope further into more extreme environments or combining multiple characterization techniques to gain better information on the coatings behavior.
H3. Invited Speakers:
- Shen Dillon, University of Illinois at Urbana-Champaign
- Verena Maier-Kiener, Montanuniversität Leoben, Austria
- Benoit Merle, University of Kassel, Germany, “Nanoindentation Measurements at Combined High Sustained Strain Rates and Elevated Temperatures”